Provider: Japan Science and Technology Agency Database: J-STAGE Content:text/plain; charset="utf-8" TY - JOUR TI - Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches TI - AU - Kim,Jong-Man AU - Lee,Sanghyo AU - Baek,Chang-Wook AU - Kwon,Youngwoo AU - Kim,Yong-Kweon JO - IEICE Electronics Express VL - 5 IS - 11 SP - 418 EP - 423 PY - 2008 DO - 10.1587/elex.5.418 ER -