Provider: Japan Science and Technology Agency Database: J-STAGE Content:text/plain; charset="utf-8" TY - JOUR TI - Bit-error rate improvement of TLC NAND Flash using state re-ordering TI - AU - Chang,Ik Joon AU - Yang,Joon-Sung JO - IEICE Electronics Express VL - 9 IS - 23 SP - 1775 EP - 1779 PY - 2012 DO - 10.1587/elex.9.1775 ER -