Angle resolved total reflection fluorescence XAFS and its application to Au clusters on TiO2(110) (1 × 1)

Wang-Jae CHUN; Kotaro MIYAZAKI; Naoki WATANABE; Yuichiro KOIKE; Satoru TAKAKUSAGI; Keisuke FUJIKAWA; Masaharu NOMURA; Kiyotaka ASAKURA

doi:10.2109/jcersj2.119.890

Feature: Functions and Materials Design at Interfaces: Technical report

Angle resolved total reflection fluorescence XAFS and its application to Au clusters on TiO₂(110) (1 × 1)

Wang-Jae CHUN, Kotaro MIYAZAKI, Naoki WATANABE, Yuichiro KOIKE, Satoru TAKAKUSAGI, Keisuke FUJIKAWA, Masaharu NOMURA, Kiyotaka ASAKURA

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Keywords: PTRF-XAFS, Angle-resolved total reflection fluroscence XAFS, Gold, TiO₂(110), Three-dimensional structure, Surface structure

JOURNAL FREE ACCESS

2011 Volume 119 Issue 1395 Pages 890-893

DOI https://doi.org/10.2109/jcersj2.119.890

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Abstract

The bonding features and three dimensional structures of metal clusters on single crystal oxide surfaces can be determined by the polarization dependent total reflection fluorescence XAFS (PTRF-XAFS) method. K-edge XAFS has a cos² θ polarization-dependence to give successfully three dimensional structure while L₃ edge XAFS has a weaker polarization dependence though the L₃ edge is suitable for Au and Pt samples. In order to overcome this issue, we have developed an angle-resolved total reflection fluorescence XAFS (ARTRF-XAFS) method to determine more precise three dimensional structures of Au clusters using the L₃ edge by increase the number of data points. In this paper we described the methodologies of the ARTRF-XAFS and the results of Au clusters on the TiO₂(110) surface.

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