An Overview of Analytical Applications of Time of Flight-Mass Spectrometric (TOF-MS) Analyzers and an Inductively Coupled Plasma-TOF-MS Technique

Abstract

A brief overview of the applications of time-of-flight mass spectrometry (TOF-MS) for analytical purposes is presented. The performance of TOF-MS combined with an inductively coupled plasma (ICP) ion source is discussed in detail. The advantages of TOF-MS detectors over the quadrupole mass filters for multi-elemental analysis of fast transient signals are discussed. The applications of ICP-TOF-MS for the detection of signals from laser ablation, electrothermal vaporization, gas and liquid chromatography, capillary electrophoresis and flow-injection analysis are reviewed.