Analytical Sciences
Online ISSN : 1348-2246
Print ISSN : 0910-6340
Original Papers
Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
Masaaki KOBATAIgor PÍŠHideo IWAIHiromichi YAMAZUIHiroaki TAKAHASHIMineharu SUZUKIHiroyuki MATSUDAHiroshi DAIMONKeisuke KOBAYASHI
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Volume 26 (2010) Issue 2 Pages 227-232

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Abstract

This article reports development of a practical laboratory hard X-ray photoelectron spectroscopy (HXPS) system by combining a focused monochromatic Cr Kα X-ray source, a wide angle acceptance objective lens and a high kinetic energy electron analyzer. The Cr Kα source consists of a Cr target, a 15 kV focused electron gun, and a compact bent crystal monochromator. The X-ray spot size is variable from 10 μm (1.25 W) to 200 μm (50 W). A wide acceptance angle objective lens is installed in front of a hemispherical analyzer. The total resolution of 0.53 eV was obtained by Au Fermi-edge measurements. Angle acceptance of ±35° with angle resolution of 0.5° was achieved by measuring Au 3d5/2 peak through a hemicylinder multi-slit on an Au thin strip, in angle resolution mode. As the examples, silicon based multilayer thin films were used for showing the possibilities of deeper (larger) detection depth with the designed system.

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© 2010 by The Japan Society for Analytical Chemistry
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