Analytical Sciences
Online ISSN : 1348-2246
Print ISSN : 0910-6340
ISSN-L : 0910-6340
CHARACTERIZATION OF CuInSe2 THIN FILMS
SHIGEMI KOHIKIMIKIHIKO NISHITANIKUMIKO NISHIKURATAKAYUKI NEGAMITAKAHIRO WADATAKASHI HIRAO
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1991 Volume 7 Issue Supple Pages 1211-1214

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Abstract

We have observed a negative shift of the CuInSe2 valence band maximum in x-ray photoemission along with the conduction type conversion from p- to n-type induced by the decrease of Cu/In ratio of molecular beam deposited thin films. The Cu rich films showed low-resistivity and p-type conduction. The near stoichiometric films showed intermediate-resistivity and n-type conduction. The In rich films showed high-resistivity and n-type conduction. The electron diffraction pattern revealed that the films had the tetragonal chalcopyrite structure. No additional second phase was detected in the films.

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