1991 Volume 7 Issue Supple Pages 1221-1224
119Sn CEMS was applied to chemical state analyses of tin included in ITO films, tin oxides for a gas sensor, and tin phosphate coatings. In ITO films, a doublet of Sn(IV) incorporated in In2O3 lattice and a singlet of segregated Sn(IV) were observed. The contents of reduced tin in tin oxide gas sensors were dependent on the presence or absence of activator and acceptor for gas. Sn(II) phosphate, adsorbed SnO2 species, and metallic tin were observed in Mn and Zn phosphate coatings, treated by stannous chloride, while Sn(IV) species were produced in tin phosphate prepared by plasma sputtering.