Contrast and Sensitivity Enhancement in Photothermal Reflectance Microscopy through the Use of Specific Probing Wavelengths: Applications to Microelectronics

Jerias A. BATISTA; Douglas TAKEUTI; Antonio M. MANSANARES; Edson C. da SILVA

doi:10.14891/analscisp.17icpp.0.s73.0

Proceedings of 11th International Conference of Photoacoustic and Photothermal Phenomena

DOI https://doi.org/10.14891/analscisp.17icpp.0.s73.0

会議情報

PA and PT Imaging and Microscopy

Contrast and Sensitivity Enhancement in Photothermal Reflectance Microscopy through the Use of Specific Probing Wavelengths: Applications to Microelectronics

Jerias A. BATISTA, Douglas TAKEUTI, Antonio M. MANSANARES, Edson C. da SILVA

著者情報

会議録・要旨集フリー

p. s73-s75

詳細

責任著者(Corresponding author)

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