Behaviormetrika
Online ISSN : 1349-6964
Print ISSN : 0385-7417
ISSN-L : 0385-7417
A BINOMIAL ERROR MODEL WITH A TRUNCATED LATENT DISTRIBUTION AND ITS APPLICATION
Manabu Suzuki
著者情報
ジャーナル 認証あり

1983 年 10 巻 14 号 p. 49-58

詳細
抄録

A binomial error model which has a truncated beta distribution as its latent trait distribution is proposed for the analysis of test scores. This model can be used when the population of the examinees is assumed to be a restricted one.
A procedure, the method of moments, is given to estimate the truncated points. An application of this model to the Japanese preliminary university entrance examination is also shown.

著者関連情報
© The Behaviormetric Society of Japan
前の記事 次の記事
feedback
Top