1983 年 10 巻 14 号 p. 49-58
A binomial error model which has a truncated beta distribution as its latent trait distribution is proposed for the analysis of test scores. This model can be used when the population of the examinees is assumed to be a restricted one.
A procedure, the method of moments, is given to estimate the truncated points. An application of this model to the Japanese preliminary university entrance examination is also shown.