抄録
XAFS (X-ray Absorption Fine Structure) is a powerful technique, which provides element-specific information on atomic and electronic structures even for samples without long-range periodic structure. Owing to the recent developments of synchrotron radiation facilities, it has become possible also for non-expert researchers to obtain such information using XAFS. In this lecture, the basic concept and analytic procedures are presented including the utilization of X-ray polarization and time-resolved measurements.
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