Butsuri
Online ISSN : 2423-8872
Print ISSN : 0029-0181
ISSN-L : 0029-0181
Development of Electron Beam 1on Trap (EBIT) for Studies with Highly Charged Ions
Nobuyuki Nakamura, Shunsuke Ohtani
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1997 Volume 52 Issue 12 Pages 919-923

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