2014 年 48 巻 1 号 p. 31-38
Mineral/fluid interfaces are crucial for the fluid composition, crystal growth, recovery of toxic elements, enhanced oil recovery, and frictional strength of fault-forming minerals. The structures of the interfaces have been directly measured by the surface X-ray scattering method. In this review, we explain the X-ray crystal truncation rod (CTR) method, which is a kind of the surface X-ray scattering method. The CTR measurements can reveal the electron density profiles of the mineral/fluid interfaces with high resolution (<0.1 nm). A combination of the CTR measurements and molecular simulations is useful for understanding the hydration structures of adsorbed ions, structures of mineral surface, and electrical double layer.