A Study of X-ray Diffraction on the Cell Wall of a Stem Internode of Wheat Treated with Gibberellin

抄録

1. The first and the second internodes of spring wheat, Konosu No. 25, cultured on a medium containing gibberellin (5×10^-4M) was investigated by means of X-ray diffraction technique.
2. The X-ray diffraction diagrams obtained from the control plants showed the presence of the cellulose micelles oriented in two directions crisscrossing each other at an angle of about 45° to the longitudinal axis of the stem.
3. In the diagrams of the cell walls in the plants treated with gibberellin, the cellulose micelles oriented at random showing more in an amorphous state than the cellulose micelles in untreated cell walls.