e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference Papers -ALC'03-
Toward Single Atom Chemical Analysis with STM
Tien T. Tsong
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2003 Volume 1 Pages 102-105

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Abstract

An important function of microscopy is the chemical analysis of the sample. Chemical analysis with an atomic resolution microscope can mean two different things. First, for a sample of known composition or adsorbed species, it means distinguishing the chemical species from the atomic image. Second, for a sample of unknown composition, it means the identification of the chemical components from the atomic resolution image. Here I compare available methods of chemical identification in field ion microscopy (FIM) and scanning tunneling microscopy (STM), and report our progress in achieving true atomic resolution for a non-destructive chemical analysis of a sample surface using STM.[DOI: 10.1380/ejssnt.2003.102]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
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