EXAFS Study of the Local Structure of Bismuth Film Deposited at Liquid Nitrogen Temperature

Abstract

The local structure of bismuth film deposited at liquid nitrogen temperature was investigated by the extended X-ray absorption fine structure (EXAFS) analysis. In the Fourier transform of EXAFS function the peak originated from the intralayer first nearest neighbor (1NN) correlation exists while that originated from the interlayer 1NN correlation disappears. This suggests that the primary structure remains but the secondary structure is disrupted. [DOI: 10.1380/ejssnt.2013.110]