e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
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Erratum: Influence of Oxygen Concentration of Si Wafer Surface in Si Emission on Nano Ordered Three-Dimensional Structure Devices [e-J. Surf. Sci. Nanotech. Vol. 15, pp. 127-134 (2017)]
Etsuo FukudaTetsuo EndohTakashi IshikawaKoji IzunomeKazutaka KamijoMoriya MiyashitaTakao SakamotoHiroyuki Kageshima
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2018 Volume 16 Pages 375

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The publisher would like to apologize for errors that occurred in the article [E. Fukuda et al., e-J. Surf. Sci. Nanotech. 15, 127 (2017)] published on 14 December, 2017. [DOI: 10.1380/ejssnt.2018.375]

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