液晶分子配向方向に依存しないTNセルの厚み及びツイスト角の測定における新ストークスパラメータ法

抄録

In order to determine cell thickness and twist angle of TNLC cells accurately, a new Stokes parameter method named improved Stokes parameter method (ISPM) is presented, which is independent on the LC molecular alignment directions at the front substrate of the cell. The function equations of the Stokes parameters with cell thickness and twist angle are deduced, and the experiment method are introduced. The preliminary experimental results verify its validity. Finally, the measurement accuracy of this ISPM is discussed.