Electrochemistry
Online ISSN : 2186-2451
Print ISSN : 1344-3542
ISSN-L : 1344-3542
Communication
Tensile Stress in Buckled Metal-Plated Silicon Whisker
Naoki MINAMIKatsuyoshi KOBAYASHI
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JOURNALS OPEN ACCESS

2007 Volume 75 Issue 5 Pages 400-402

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Abstract

A deformation and a breakdown after buckling of metal films plated on silicon whisker were studied. The tensile stress of deformed column with one end fixed and the other pinned at maximum curvature, F(α)max, was derived, and each F(α)max of silicon whisker and plated metal films was calculated. When F(α)max exceeds tensile strength of constituent metal film, a breakdown is occurred. Critical load for buckling and overdrive at breakdown can be estimated with elastic constant, distance from neutral plane, and thickness of metal film, and length of silicon whisker.

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© 2007 The Electrochemical Society of Japan
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