Erratum: Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [IEICE Electronics Express Vol. 10 (2013) No. 20 pp. 20130516]

Jin Woo Jung; Yong Seo Koo; Kwang Yeob Lee

doi:10.1587/elex.10.20138001

IEICE Electronics Express

Online ISSN : 1349-2543
ISSN-L : 1349-2543

ERRATA

Erratum: Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [IEICE Electronics Express Vol. 10 (2013) No. 20 pp. 20130516]

Jin Woo Jung, Yong Seo Koo, Kwang Yeob Lee

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JOURNAL FREE ACCESS

2013 Volume 10 Issue 21 Pages 20138001

DOI https://doi.org/10.1587/elex.10.20138001

J-STAGE : elex 10 20 pp.20130516-20130516

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