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IEICE Electronics Express
Vol. 2 (2005) No. 21 P 542-547

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http://doi.org/10.1587/elex.2.542

LETTER

We report the design, fabrication and electromechanical performance of a newly developed micro electromechanical XY-scanner for micro-optical spatial light modulation using the silicon micromachining technology. A two-dimensional stage is integrated with a silicon micro lens to scan a transmitting infrared light of 1.55-micron-wavelength by the mechanism of the ƒ-θ lens scanner. Mechanical displacement of up to ± 10 microns (optical angle of ± 0.57 degrees) was obtained with a drive voltage of 30V; optical simulation has suggested that the scanner can be used to construct a free-space optical crossconnect of 9-input by 9-output port counts.

Copyright © 2005 by The Institute of Electronics, Information and Communication Engineers

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