Application dependent FPGA interconnect test method with small test configuration number using SMT net-grouping constraints

抄録

An application dependent FPGA interconnect testing scheme is presented. The goal is to reduce the number of test configurations while keeping high fault coverage. Reduction is done by using SMT constraints that allow multiple nets as a group to use one input vector, so that the number of test configurations is reduced. Based on the complete fault model, a novel approach to generate SAT formulas, most notably dominant bridging faults, is explained to retain coverage. Experiments on FPGAs shown that this method yield on average 23.5% fewer configurations on circuits with 1000~70000 LUTs comparing with existing methods, with full fault coverage.