A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm

抄録

The demand for fault diagnosis has increased with the increasing complexity of VLSI devices. Recent analysis has found that multiple defects frequently exist in failing chips. Therefore, the diagnosis of multiple defects is very important and is needed in the industry. Here we propose a multiple-defect diagnosis method using an efficient selection algorithm that can handle various defect behaviors. The experimental results for the full-scan version of the ISCAS ’89 benchmark circuits demonstrate the efficiency of the proposed methodology in diagnosing circuits that are affected by a number of different types of defects.