1) University of Chinese Academy of Sciences
2) Institute of Microelectronics of Chinese Academy of Sciences
3) School of Microelectronics, University of Chinese Academy of Sciences
NAND flash memory, threshold voltage distribution, EM algorithm, LDPC code, soft information
The final version of this article with its full bibliographical information is available. To access the article, click here (Vol. 14 (2017), No. 18 pp. 20170820-20170820).
A dynamic log-likelihood ratio (DLLR) scheme based on expectation-maximization (EM) algorithm for the decoding of low-density parity-check (LDPC) codes in NAND flash memory is proposed. When LDPC soft decoding fails, the DLLR scheme employs the EM algorithm to estimate the parameters of the threshold voltage distribution of NAND flash memory, and then recalculates the LLR values for decoding. Simulation results show that the proposed scheme can significantly improve the error correcting performance of LDPC soft decoding in NAND flash memory.
Edited and published by : The Institute of Electronics, Information and Communication Engineers Produced and listed by : Komiyama Printing Co., LTD.