IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543

This article has now been updated. Please use the final version.

Digital Twin of Intermediate Layer Temperatures Observation of IGBT Modules
Mingxing DuXinyu CaiCong Zhang
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JOURNAL FREE ACCESS Advance online publication

Article ID: 22.20250257

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Abstract

IGBT module requires accurately intermediate layer temperatures (ILT) monitoring to ensure system safety and reliability. Considering critical failure factor of solder layer voids, this paper implements real-time monitoring to IGBT module ILT using DT. By deriving the nonlinear relationship between thermal resistance of solder layer and junction temperature, a mathematical model is refined to more precisely reflect the actual thermal behavior of IGBT. A nonlinear intermediate layer temperatures observer is designed to further improve the accuracy. Experimental validation demonstrates that, the proposed observer significantly enhances the precision with an error of only 0.1% compared to traditional methods.

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