抄録
Nuclear emulsions containing fine microcrystals typically exhibit low sensitivity to charged particles. However, the absolute assessment of the sensitivity of nuclear emulsions to charged particles based on physical quantities has not been previously addressed. A new method utilizing crystal sensitivity, defined as the ratio of the number of developed silver grains to the number of silver halide microcrystals per unit length tra- versed by charged particles, is proposed. Two types of emulsion plates with crystal sizes of 70 nm and 200 nm were irradiated with four dif- ferent types of charged particles with various energy deposition. The crystal sensitivity increased with increasing energy deposition in both emulsions. Notably, the crystal sensitivity of the 70 nm size was lower than that of the 200 nm size. The crystal sensitivity of the former satu- rated at approximately 50%, even though the latter at 100%. This low sensitivity can be attributed to significant recombination of elec- tron-hole pairs and, to some extent, re-halogenation enhanced in small crystals.
https://ror.org/02hcx7n63 
