鉱物学雜誌
Online ISSN : 1883-7018
Print ISSN : 0454-1146
ISSN-L : 0454-1146
X線粉末Rietveld解析へのフーリエ法の導入とゼオライト系ケイ酸塩構造解析への適用例
佐藤 満雄黒沢 聡
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ジャーナル フリー

1986 年 17 巻 5 号 p. 207-216

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In the application X-ray Rietveld analysis, there is a problem which is not yet solved. As well known, the Rietveld analysis is based on the least squares method, so it is impossible to solve the unknown structure by using this method only. In order to obtain valuable information of unknown structures it is necessary to introduce Fourier synthesis method into the Rietveld process. For this purpose, Rietveld system is tried to combine with UNICS III system which includes many useful programs for single crystal structure analysis. Both systems are designend to be easily connected by simple TSS operations. An application example of the system to the crystal structure analysis of zeolite L is given and compared with the result given by Barrer and Villiger.
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