特集 「極微量元素分析法」
PIXE (イオンビーム法)
1990 年 16 巻 2 号 p. 20-34
詳細
1990 年 16 巻 2 号 p. 20-34
In this review article, characteristics of PIXE, such as ionization cross section, detection limit, estimation of backgrounds, necessary time for measurement, etc. are explained. Application of PIXE is also reviewed in the fields of medical, biological and archeological science, and for electric and metallic materials.
