The Refraction Contrast Imaging using Micro Focus X-ray Source

Abstract

X-ray imaging has been widely used for applications such as non-destructive inspection. This study aims at high-contrast imaging for low-absorption materials using refraction-contrast imaging with a high-coherence X-ray source. In this letter, we report the results of imaging experiments using seeds inside fruits via conventional imaging and refraction contrast imaging. Although a seed was difficult to be detected using the conventional method, it was clearly observed in the refraction contrast imaging. This letter describes the possibility of a non-destructive food inspection.