IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Electronic Materials and Devices>
Soft X-ray Synchrotron Radiation Photoemission Spectroscopy of Cs-Containing Montmorillonite
Yuden Teraoka
Author information
JOURNAL RESTRICTED ACCESS

2020 Volume 140 Issue 4 Pages 412-416

Details
Abstract

High resolution photoemission spectroscopy with soft X-ray synchrotron radiation has been applied to montmorillonite, one of phyllosilicate compounds. Charge build-up is inevitable in the powder sample due to its insulating property so that photoemission peaks of element components are difficult to be assigned. On the other hand, photoemission peaks have been observed at their original peak positions without the charge shift. These non-shifted peaks enabled determination of binding energies of element components. Information on chemical bonding states of cesium, adsorbed artificially in the montmorillonite, has been also obtained.

Content from these authors
© 2020 by the Institute of Electrical Engineers of Japan
Previous article Next article
feedback
Top