Selectively Removing the Textural Information by Using Wavelet Shrinkage with an Application to Textile Surfaces Inspection

Abstract

In this paper, we propose a new method for the visual inspection such as defects detections of textile sur-faces; selectively removing the textural information from textile surfaces. For this purpose, we use Wavelet Shrinkage, which was originally proposed by Donoho & Johnstone as a method to remove Gaussian white noise. We also propose a modification of Wavelet Shrinkage to selectively remove the textural information from textile surfaces. Once the textural information is removed from textile surfaces, the remaining process-ings of inspection can be conducted in the image domain. So we can utilize the image processing methods and techniques developed so far for the visual inspections of other industrial products.