IEEJ Transactions on Industry Applications
Online ISSN : 1348-8163
Print ISSN : 0913-6339
ISSN-L : 0913-6339
Digital Contour Length Measurement by Skipped Dual Lines Raster Scanning
Katsuyuki NakashimaYutaka ObuchiKatsunori Inoue
Author information
JOURNALS FREE ACCESS

1993 Volume 113 Issue 3 Pages 357-363

Details
Abstract

This paper discribes about a new algorithm for digital length measurement. In this algorithm, the way of data access is Skipped Dual Lines raster Scanning, so it is named “SDLS” method. Using SDLS, the contour length of binary image can be measured with high speed and high accuracy. Theoretical expression of contour length based on SDLS method is derived for the figure which consists of linear edge. In case of square and circle figure, it is proved by the computer simulation that the most accurate data is obtained when skip number=1. As these results, SDLS method is very useful for industrial application, especially for measuring moving objects.

Information related to the author
© The Institute of Electrical Engineers of Japan
Previous article Next article
feedback
Top