IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
Paper
Development of AFM Tweezers for Manipulation of Nanometer Size Objects
Tetsuya TakekawaKazuhisa NakagawaGen HashigutiMasato SaitouKeiichirou YamanakaEiichi Tamiya
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2005 Volume 125 Issue 11 Pages 448-453

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Abstract
A prototype of AFM (Atomic Force Microscope) tweezers will be presented. In order to combine the functions of nano objects manipulation with AFM observation, we have developed a tweezers-type AFM probe device using micromachining technology. The device has two thin wedge-type arms shaped by anisotropic etching of silicon and local oxidation of silicon in techniques; one plays the role of an AFM probe, and another plays that of a manipulation probe in cooperation with manolithically fabricated micro actuators. The AFM tweezers will offer new research methods in bio/nano technology.
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© 2005 by the Institute of Electrical Engineers of Japan
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