電気学会論文誌E(センサ・マイクロマシン部門誌)
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
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CMOS互換「配線MEMSプロセス」によるMEMS-CMOS LSIモノリシック集積化圧力センサ
藤森 司鷹野 秀明花岡 裕子後藤 康
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2010 年 130 巻 5 号 p. 170-175

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Back-end-of-line (BEOL) MEMS processes for a compact, high-precision pressure sensor was developed. A CMOS-LSI-integrated capacitive pressure-sensor was fabricated with a chip size of 0.72 mm2 using developed BEOL MEMS processes. Multi-sensor chip (with a size of 1.7 by 1.9 mm2) which consists of pressure sensor, temperature sensor and high-precision measurement circuits was also fabricated, and precise atmospheric pressure measurement (∼ 10 Pa) was demonstrated. As the sensitivity of pressure sensor can be easily changed by the size of its MEMS capacitors, the pressure sensor is thus suitable for various pressure-range applications.

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