電気学会論文誌E(センサ・マイクロマシン部門誌)
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
A Study on the Sub-Micron LIGA Process
Hiroshi UenoSusumu Sugiyama
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2001 年 121 巻 1 号 p. 45-50

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Microstructures with sub-micron widths and gaps (lines and spaces) can be applied to practical and high performance MEMS devices. In the sub-micron LIGA process, one of the most crucial considerations is the fabrication of an X-ray mask with thick X-ray absorbers having sub-micron width. An X-ray mask, which is composed of 1μm-thick Au with a 0.6μm line width and a 0.2μm space as absorbers, 2μm-thick SiC with 240MPa of tensile stress as a membrane and 625μm-thick Si as a frame, was fabricated. As a result of the sub-micron LIGA process, a sub-micron PMMA structure with a maximum aspect ratio of 85, corresponding to 0.2μm minimum width, 6μm length and 17μm height, and sub-micron Ni structures with a maximum aspect ratio of 75, corresponding to 0.2μm minimum width and 15μm height, were fabricated.

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© The Institute of Electrical Engineers of Japan
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