Development and Evaluation of New Material Measure with Chirp Form for Surface Texture Instruments

抄録

This study designs and develops a new material measure with a chirp form. Material measures are measurement standards for calibration, verification, and inspection. Since material measures are essential for ensuring the traceability of surface texture instruments, we have been developing a manufacturing system to provide them. ISO 5436-1:2000 contains material measures with sinusoidal wave forms, random wave forms, triangular wave forms, trapezoidal wave forms, cusp forms, rectangular forms, etc. However, ISO 5436-1:2000 does not contain a material measure with a chirp (sweep) form. Therefore, we propose a material measure with a chirp form. Chirp signals are frequently used for various analyses in the fields of mechanical engineering, electrical engineering, physics, and others. The primary purpose of the proposed material measure with a chirp form is to rapidly and simply examine the characteristics and capabilities of implemented Gaussian filters. We designed the surface form of the material measure as a logarithmic chirp form to maximize the utility of the primary purpose in this study. The wavelength of the manufactured chirp form varies logarithmically in the lateral (x) direction. This paper presents the following five points: 1) the design and development of the material measure with a chirp form, 2) the application of the proposed material measure to the examination of the attenuation characteristics of implemented Gaussian filters, 3) the application of the proposed material measure to obtain the deformation of the roughness form due to the implemented Gaussian filters, 4) the application of the proposed material measure to specify the algorithm of the implemented Gaussian filters, and 5) the possibility of another application of the material measure with a chirp form.