ISIJ International
Online ISSN : 1347-5460
Print ISSN : 0915-1559
ISSN-L : 0915-1559
Regular Article
Optical Line Scan Inspection System for Pseudo-particle Analysis
Jin-Luh MouYi-Min SunYu-Cheng ChenChih-Wei LiaoYung-Sing Tarng
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2007 Volume 47 Issue 9 Pages 1280-1283


A pseudo-particle size analysis instrument by optical line scan technology has been developed. The developed system composes of four major modules, which are materials feeding module, image acquired module, vision procession module and control unit. The main advantages of this system include total analysis without overlapping or missing of slipping particles, and pseudo-particle separation without breaking the granulation structure. The information gathered from the results covers pseudo-particle size distribution, mean size, roundness, sphericity, and uniformity. This is a powerful instrument for any kinds of small particle analysis.

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© 2007 by The Iron and Steel Institute of Japan
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