ISIJ International
Online ISSN : 1347-5460
Print ISSN : 0915-1559
ISSN-L : 0915-1559
Note
Measurement of Trace Amount of Cadmium Using a Portable Total Reflection X-Ray Fluorescence Spectrometer
Shinsuke KunimuraKatsuyuki Amagasu
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2015 Volume 55 Issue 12 Pages 2697-2699

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Abstract

This note describes a method for detecting Cd L-lines from a trace amount of cadmium using a portable total reflection X-ray fluorescence spectrometer. When the measurement was carried out in vacuum, the Ar K-lines (Ar Kα line: 2.96 keV, Ar Kβ line: 3.19 keV) that overlap with the Cd L-lines (Cd Lα line: 3.13 keV, Cd Lβ line: 3.32 keV) were remarkably reduced and the Cd L-lines from an analyte containing 1 ng of cadmium were detected. Although the K Kα line (3.31 keV) also overlaps with the Cd L-lines, solid-phase extraction for removing potassium from a sample solution containing both cadmium and potassium led to significant reduction in the intensity of the K Kα line. A combination of solid-phase extraction and measurement in vacuum makes it possible to analyze a trace amount of cadmium using the portable spectrometer.

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© 2015 by The Iron and Steel Institute of Japan
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