5.3 : Electrical Reliability of Two- and Four- a-Si : HTFT Pixel Electrode Circuits for Active-Matrix OLEDs(2.2 Session 5 : EL AND OLEDs)(Report on the 20th International Display Research Conference)

Y. He; R. Hattori; J. Kanicki

doi:10.11485/itetr.24.66.0_28_3

ITE Technical Report

Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893

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24.66

Session ID : IDY2000-316

DOI https://doi.org/10.11485/itetr.24.66.0_28_3

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5.3 : Electrical Reliability of Two- and Four- a-Si : HTFT Pixel Electrode Circuits for Active-Matrix OLEDs(2.2 Session 5 : EL AND OLEDs)(Report on the 20th International Display Research Conference)

Y. He, R. Hattori, J. Kanicki

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