ITE Technical Report
Online ISSN : 2424-1970
Print ISSN : 1342-6893
ISSN-L : 1342-6893
24.66
Session ID : IDY2000-312
Conference information
7.2 : A New Poly-Si TFT employing a Cavity at the Edge of Gate Oxide(Report on IDMC2000)
Min Cheol
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© 2000 The Institute of Image Information and Television Engineers
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