Mark-profile simulation of phase change media at high linear velocity

Abstract

Phase-change optical disk which can be recorded and erased with high linear speed is studied to realize high data transfer rate. The crystallization speed of phase-change material must be raised for high-data-transfer rate. However, the re-crystallization of the phase-change material is a problem if crystallization speed is too high. Therefore, it is necessary for accurate mark to estimate characteristics of recording medium and to decide recording strategy. In this report, the problem which is clarified from the experiment is confirmed by the mark profile simulation using three-dimensional thermal calculation and Johnson-Mehl-Avrami equation, and the solution using recording strategy is reported.