特集「個別組成分析や浮遊状態計測を目指す最新計測分析技術とその応用」
粒子ビーム状態における半導体メゾスコピック粒子の分光計測による物性研究
2004 年 19 巻 1 号 p. 34-39
詳細
2004 年 19 巻 1 号 p. 34-39
Unique behavior of nanoparticles has attracted a great deal of attention from mainly two points of view, i.e. an intensified reactivity due to large surface-to-volume ratios and novel electronic properties due to the quantum size effect. Development of optical measurement methods for nanoparticles suspended in vacuum or gas flow is very important not only for an in situ particle monitoring in gas phase but also for scientific study of semiconductor nanoparticles or clusters, because the optical properties are influenced by the surface conditions or the surrounding matter. This review introduces recent progress in spectroscopic studies of semiconductor nanoparticles in vacuum or gas flow.
