Earozoru Kenkyu
Online ISSN : 1881-543X
Print ISSN : 0912-2834
ISSN-L : 0912-2834
Feature Articles —Advances and Applications in Microscopic Observation and Analysis of Fine- and Nano-Aerosols Across Various Fields—
Development and Applications of High-Resolution Time-of-Flight Mass Spectrometer—Aiming at Detailed Analysis of Single Small Particles—
Tetsuo Sakamoto
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Keywords: TOF-SIMS, FIB, Surface Analysis, Instrumentation, Individual Particle Analysis
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2026 Volume 41 Issue 2 Pages 107-114

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© 2026 Japan Association of Aerosol Science and Technology

この記事はクリエイティブ・コモンズ [表示 - 非営利 - 改変禁止 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc-nd/4.0/deed.ja
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