窯業協會誌
Online ISSN : 1884-2127
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EXAFS分光法によるGeO2-P2O5系ガラスの局所構造研究
清水川 豊尹 成東奥野 正幸森川 日出貴丸茂 文幸宇田川 康夫持田 統雄関谷 隆夫
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95 巻 (1987) 1100 号 p. 418-422

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The Ge EXAFS (extended X-ray absorption fine structure) above its K absorption edge was measured for GeO2-P2O5 glasses containing up to 49mol% PO5/2 (here, chemical formula is defined as PO5/2). The Ge-O distance was determined to be 1.72-1.76Å by the curve fitting method. It was shown that a part of Ge atoms changes their coordination number from 4 to 6 on introducing P2O5 into GeO2 glass. The fraction of six-coordinated Ge atoms (N6) was estimated from the Ge-O distances obtained by EXAFS analysis and the result agreed with the value of N6 estimated from molar volume using partial molar volumes of Vp=24.20, VGe(4)=28.71 and VGe(6)=19.60cm3. N6 approximately followed a formula N6=x/2(1-x), where x is the molar fraction of PO5/2.

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