Journal of the Ceramic Society of Japan
Online ISSN : 1348-6535
Print ISSN : 1882-0743
ISSN-L : 1348-6535
Regular Issue: Special Articles: The 73rd CerSJ Awards for Academic Achievements in Ceramic Science and Technology: Review
Atomic-resolution differential phase contrast electron microscopy
Naoya SHIBATA
Author information
JOURNALS FREE ACCESS

2019 Volume 127 Issue 10 Pages 708-714

Details
Abstract

Ultra-high spatial resolution better than 0.5 Å has been achieved in aberration-corrected scanning transmission electron microscopy (STEM). By combining such an ultra-high resolution STEM with a differential phase contrast (DPC) imaging technique, we can now directly visualize the electric field distribution inside individual atoms in real space. The atomic electric field, i.e., the field between the nucleus of the atom and the electron cloud that surrounds it, contains information about the atomic species and charge redistribution due to chemical bonding. In this review, the current status of the development in atomic-resolution DPC STEM and its future direction is discussed.

Information related to the author
© 2019 The Ceramic Society of Japan
Previous article Next article
feedback
Top