日本結晶学会誌
Online ISSN : 1884-5576
Print ISSN : 0369-4585
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電子線小角散乱法を用いた磁気微細構造解析
戸川 欣彦小山 司森 茂生
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2013 年 55 巻 2 号 p. 121-127

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Quantitative reciprocal-space analyses of magnetic fine structures in magnetic artificial lattices of patterned elements and chiral helimagnets have been performed by means of small-angle electron scattering (SAES) technique. Lorentz deflection due to magnetic moments and Bragg diffraction due to lattice periodicity are simultaneously recorded at an angle of the order of 1×10−6 rad using long-distance camera length more than 100 m. The present SAES technique,together with TEM real-space imaging method such as in-situ Lorentz microscopy, is very powerful in analyzing electromagnetic fields in nano-scaled materials. The existence of both chiral helimagnetic order and chiral soliton lattice in a chiral helimagnet CrNb3S6 has been successfully verified using the present methods.

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