2014 年 56 巻 5 号 p. 296-300
Synchrotron X-rays are very suitable for advanced crystal structure analysis in material science. In fact, many scientists carry out various experiments in order to understand physical and functional property. Extremely, charge density study, submicron single crystal diffractometry, operand structural study of single crystal and poly-crystals, and time-resolved experiments have been actively engaged in research on the structure analysis in order to elucidate the association between functional properties and crystalline structures. Here, I report current research and future outlook of structure analysis using synchrotron X-rays.