フォトン・ファクトリーにおけるX線測定系
―多線式比例検出器―
1976 年 18 巻 2 号 p. 102-106
詳細
1976 年 18 巻 2 号 p. 102-106
Recent developments and the present state of art of the position sensitive proportional counters for X-ray diffraction are described. This kind of detector incorporated to a highspeed memory can provide very powerful means for rapid collection of diffraction data using synchrotron radiation. Briefly described are various methods for reading out impact locations of X-ray photons from multiwire proportional chamber detectors.
