日本結晶学会誌
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
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高橋 敏男
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1997 年 39 巻 1 号 p. 94-98

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The structure of crystal surfaces is studied by X-Ray diffraction. The Si (111) √3×√3-Bi structure was analyzed in terms of reflectivity, and the coverage-dependent structures were unambiguously distinguished. The structure of the dimer in Si (001) 2×1 was determined.

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