GaAs単結晶の格子間隔の高精度測定
1997 年 39 巻 1 号 p. 99-104
詳細
1997 年 39 巻 1 号 p. 99-104
Characterization by high precision lattice spacing measurement using synchrotron radiation is reviewed, Relationship between lattice spaciing and residual strain, dislocation density, composition of raw material and cell structures are given.
