J-STAGE トップ  >  資料トップ  > 書誌事項

日本結晶学会誌
Vol. 44 (2002) No. 6 P 380-388

記事言語:

http://doi.org/10.5940/jcrsj.44.380


The combination of RIETAN-2000 and a new MEM analysis program PRIMA enables us to represent crystal structures with densities of electrons (X-ray diffraction) or coherent-scattering lengths (neutron diffraction) instead of structure parameters in Rietveld analysis. We have devised sophisticated methodology named MEM-based pattern fitting, where whole-pattern fitting and MEM analysis are alternately repeated to reduce the bias of a structural model in Rietveld analysis as much as possible. Applications of MPF to some compounds will be demonstrated. A 3D visualization program VENUS serves to display and manipulate electron and scattering-length densities, electrostatic potentials, wave functions, and so forth.

Copyright © 日本結晶学会

記事ツール

この記事を共有